Structured Illumination Microscopy

Structured Illumination Microscopy (SIM) is a super-resolution strategy that employs an algorithm to create a single super-resolution image from a series of individual pictures each acquired through a moving diffraction grating placed in different positions that generates “moiré fringes”.  The position of the grating in each image and other characteristics of the microscope configuration such as the Point Spread Function (PSF) are used to extract super-resolution information in Fourier space that can result in a greater than two-fold grain in resolution.  SIM can be employed in TIRF, 2D and 3D modalities, and live-cell SIM can be readily achieved.

See our chapter on super-resolution microscopy for more details.